MIT.nano symposium highlights applications of ambient sensing.
MIT.nano
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Sensing the world around us
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MIT.nano adds new instruments to create and analyze at the nanoscale
New tools can accommodate samples from small pieces up to 200 mm wafers.
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VELION focused ion beam scanning electron microscope expands MIT.nano capabilities
FIB-SEM is now available to researchers across the Institute for use in characterization, nanofabrication, and rapid prototyping.