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Krystyn Van Vliet

  • Researchers pioneer a new way to detect microbial contamination in cell cultures

    SMART-CAMP-Shruthi-Pandi-Chelvam
    Wednesday, June 29, 2022

    An anomaly-detection model developed by SMART utilizes machine learning to quickly detect microbial contamination.

    Researchers pioneer a new way to detect microbial contamination in cell cultures
    Krystyn Van Vliet, SMART
    Read more: Researchers pioneer a new way to detect microbial contamination in cell cultures
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